New silicon detection analyzer
XOS (USA) has rolled out a new product, the Signal analyzer. It features XOS’s Monochromatic Wavelength Dispersive X-Ray Fluorescence (MWD XRF) to detect silicon down to 0.5 ppm. XOS touts themachine’s ability to offer great precision with the push of a button. The Signal effectively eliminates extensive sample preparation associated with ICP while offering better precision in a 10-minute measurement cycle: Placing the sample in a standard XRF sample cup is the only handling required for the measurement. This silicon quantification capability is available for petroleum matrices, additives and biofuels, including ethanol. XOS’s MWD XRF platform technology is also used in the company’s Sindie and Clora line analyzers to quantify sulfur and chlorine in hydrocarbon, aqueous and biofuels matrices.
“XOS is leading the ASTM D2.03 Task Group for the development of an ASTM standard test method for the Signal technology, and a wide ranging inter-laboratory study has been completed in support of this ASTM method development effort,” said Berry Beumer, vice president of sales and marketing at XOS.
MWD XRF uses focusing and monochromating optics to increase excitation intensity. The company says it offers a dramatic improvement of signal-to-background over high-power traditional WD XRF instruments. This enables improved detection limits and enhanced precision from crude oils matrices to biofuels. MWD XRF is a direct measurement technique that does not require sample treatment or sample conversion and does not involve high-temperature operations or processing.
For more information, contact XOS at info@xos.com or visit www.xos.com.
Comments